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NVMe stress tests for U.2 drives fail on AFF A800

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aff-series
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hw
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Applies to

  • AFF A800
  • U.2 NVMe stress test run from system-level diagnostics (sldiag)

Issue

When running stress test from system-level diagnostic (sldiag) the following errors can be observed:
 
[2021/11/03 11:44:05] Found 1 M.2 NVMe devices to stress
[2021/11/03 11:44:05] Start to clear M.2 NVMe PCI ERR statistics
[2021/11/03 11:44:06] Found 48 U.2 NVMe devices to stress
[2021/11/03 11:44:06] Start to clear U.2 NVMe PCI ERR statistics
[2021/11/03 11:45:30] NVMe stress start
[2021/11/03 11:46:47] FIO ERROR : NVME-DRIVE0 /dev/nvme5n1: zero sized block device?
[2021/11/03 11:46:47] FIO ERROR : NVME-DRIVE0 Please check /tmp/log/nvme/nvmeFIO_NVME-DRIVE0.log
[2021/11/03 11:46:48] NVME-DRIVE0 stress is terminated!!
[2021/11/03 11:46:48] FIO ERROR : NVME-DRIVE1 /dev/nvme6n1: zero sized block device?
[2021/11/03 11:46:48] FIO ERROR : NVME-DRIVE1 Please check /tmp/log/nvme/nvmeFIO_NVME-DRIVE1.log
[2021/11/03 11:46:48] NVME-DRIVE1 stress is terminated!!
................................................
[2021/11/03 11:47:16] NVME-DRIVE47 stress is terminated!!
[2021/11/03 12:15:33] NVME-BOOT0 stress is terminated!!
[2021/11/03 12:15:37] NVMe stress end

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